Data preparation and evaluation techniques for x-ray diffraction microscopy.

نویسندگان

  • Jan Steinbrener
  • Johanna Nelson
  • Xiaojing Huang
  • Stefano Marchesini
  • David Shapiro
  • Joshua J Turner
  • Chris Jacobsen
چکیده

The post-experiment processing of X-ray Diffraction Microscopy data is often time-consuming and difficult. This is mostly due to the fact that even if a preliminary result has been reconstructed, there is no definitive answer as to whether or not a better result with more consistently retrieved phases can still be obtained. We show here that the first step in data analysis, the assembly of two-dimensional diffraction patterns from a large set of raw diffraction data, is crucial to obtaining reconstructions of highest possible consistency. We have developed software that automates this process and results in consistently accurate diffraction patterns. We have furthermore derived some criteria of validity for a tool commonly used to assess the consistency of reconstructions, the phase retrieval transfer function, and suggest a modified version that has improved utility for judging reconstruction quality.

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عنوان ژورنال:
  • Optics express

دوره 18 18  شماره 

صفحات  -

تاریخ انتشار 2010